DT230-SM
Vacuum / Cleanroom rotary stages
782475:012.14 (DT230-SM)
High-resolution, stable aperture rotary stage
UHV, DUV / EUV, cleanroom ISO 6, n x 360°, rep 0.0002°, speed 180°/s, load 15 kg
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Fields of application
High-resolution, outstanding stable inspection / microscopy, e.g. AFM, electron microscope, ion microscope, scanning electron microscope, scanning tunneling microscope, transmitted light measurements in semiconductor technology, wafer inspection, laboratory microscopy, imaging systems, sample analysis, beamline instrumentation, synchrotron, materials research, materials analysis
DT230 | -SM-W | |
Travel | [deg] | n x 360 |
Repeatability unidirectional | [deg] | ± 0.0002 |
Repeatability bidirectional | [deg] | ± 0.0003 |
Positioning speed | [deg/s] | 90 |
Max. speed | [deg/s] | 180 |
Max. load Fz | [N] | 150 |
Length | [mm] | 250 |
Width | [mm] | 230 |
Height | [mm] | 100 |
Turntable | [mm] | Ø 200 |
Aperture (without insert) | [mm] | Ø 125 |
Aperture (with insert) | [mm] | Ø 25 |
Weight | [kg] | 13.1 |
Lubrication liquid | [mbar] | up to 10-8 |
Lubrication dry | [mbar] | up to 10-11 |
Max. Bakeout temperature | [deg] | 120 |
Motor | Stepper Motor | |
Bearing | Ball Bearing sainless steel, hybrid, optional full ceramic | |
Feedback | Angular Scale | |
Resolution Measuring system | 0.00002° | |
Optional features | with / without aperture, high load, custom fluorine-free / PFAS-free UHV lubrication, adapter, bore grid, cable / plugs | |
Variants clean room | up to clean room class ISO 6 (higher on request) | |
Variants beam | UV, DUV, EUV (X-ray, gamma on request) | |
Variants Magnetism | magnetic, low-magnetic, magnet-free | |
Variants vacuum | all ranges up to 10E-11 mbar HV / UHV |
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Overwiew cleanroom & vacuum systems Contact technical consultants
Elger Matthes
Development, Consulting, Concepts, Innovation
T +49 (0) 351 88585-82 |
Ronald Schulze
Consulting, Project Management & Engineering
T +49 (0) 351 88585-67 |