XYZ Inspection gantry for semiconductors | XY Linear motor, profile rail | Z Ball screw, AC servo
Inspection and Mikroscopy

782498:001.26

 

High precision automatic 3D inspection of semiconductors

This 3-axis positioning system moves a high-resolution camera or sensor on the Z-axis over the target. Based on the LA250 linear axis with linear direct drive, this system achieves high speeds and accelerations with high precision and very good reproducibility. For vertical positioning, the high-precision PLT165-AC linear stage with a powerful AC servo motor is used to drive its precision ball screw. It has a high payload capacity, even for heavy sensors.  

 

High throughput in low-maintenance 24/7 operation

  • Ideal for automated inspection of large, flat samples e.g. wafers, probe cards by means of travel bridge
  • Very long travel of 700 x 700 x 200 mm for loads up to 15 kg
  • High precision measurement with repeatability up to 0.3 µm
  • Highest stability for high magnification measurements

Optionally expandable:

  • Various travels up to 2000 mm
  • Control in Z manual or motorized
  • With/without frame and base plate made of granite or aluminum
  • ISO 14644-1 versions (up to class 1 on request)
  • Optional with pre-configured controller incl. exemplary software for immediate use

Individual extensions and customizations

Engineering services include the fitting of the systems to your structure and the desired controlls. Furthermore, we develop prototypes and like to adapt the systems to the environmental requirements of your application particle emission, radiation, temperature, precision special parts manufacturing, working height, collision protection, safety concept, compensation factor and filter, sensor mounting, brake, decoupling, special lubrication, special colors, holders, adapters, special motors with pharmaceutical approval, comprehensive documentation, test protocoll, llife cycle tests

 

Fields of application

Manufacturing / inspection / quality assurance of small components, inspection of probe cards, wafers, chips, die, pins, bonding, printed circuit boards, solar cells, chipping / crack / defect detection, surface inspection, layer thickness measurement with one sensor, pharmaceutical inspection, measurement of biological samples, alignment and inspection of optical components, setup of assembly systems in microelectronics, AOI (Automatic Optical Inspection)

 

782498:001.26

 

X

Y1

Y2

Z

Travel

[mm; deg]

700

700

700

200

Repeatability unidirectional

[µm; deg]

± 0.2

± 0.2

± 0.2

± 2

Repeatability bidirectional

[µm; deg]

± 0.3

± 0.3

± 0.3

± 2.5

Positioning speed

[mm/s; deg/s]

500

500

500

50

Max. load

[N]

250

3100

3100

1010

Motor

 

Iron Core Dynamic Linear Motor

 

Iron Core Dynamic Linear Motor

 

Iron Core Dynamic Linear Motor

 

AC-Servo

Drive

 

 

 

 

Ball Screw

Feedback

 

Linear Scale

Linear Scale

Linear Scale

Motor-Encoder

 


Angepasstes System für Ihr Gesamtkonzept


Sie suchen eine technische Lösung für Ihre Anwendung?

Jetzt den ersten 3D Entwurf in nur wenigen Tagen erhalten:

 

Katja Weißbach
Beratung
 

T +49 (0) 351 88585-64
E-Mail

 

Francisco Samuel
Beratung &
Projektmanagement

T +49 (0) 351 88585-85
E-Mail

 

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